Radiation damage and defect dynamics in 2D WS<sub>2</sub>: a low-voltage scanning transmission electron microscopy study
نویسندگان
چکیده
Abstract Modern low-voltage scanning transmission electron microscopes (STEMs) have been invaluable for the atomic scale characterization of two-dimensional (2D) materials. Nevertheless, observation intrinsic structures semiconducting and insulating 2D materials with 60 kV-microscopes has remained problematic due to radiation damage. In recent years, ultralow-voltage developed prospects minimizing damage such materials, however, date only TEM investigations reported, but similar results using STEM, despite being more widely adopted, are still missing. Here we report a quantitative analysis beam-induced defect dynamics in WS 2 during 30 kV kV-STEM imaging, particularly by recording resolution electrostatic potential movies integrated differential phase contrast visualize both light sulfur heavy tungsten atoms. Our demonstrate that aggravates factor two when halving beam energy from keV keV, which conclude electronic excitation ionization be dominant mechanism inducing defects STEM imaging
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ژورنال
عنوان ژورنال: 2D materials
سال: 2021
ISSN: ['2053-1583']
DOI: https://doi.org/10.1088/2053-1583/ac3377